Hits:
Type of Patent:发明
State of Patent:已失效
Authorization number:201410484823.6
Service Invention or Not:no
Application Date:2014-09-22
Authorization Date:2016-03-02
Pre One:基于电化学与磁珠技术的膜损检测方法与装置
Next One:一种六自由度微流控芯片吸收光谱检测支架