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Enhancing Adhesion and Reducing Ohmic Contact through Nickel-Silicon Alloy Seed Layer in Electroplating Ni/Cu/Ag
Hits:Affiliation of Author(s):500190
Journal:MATERIALS
ISSN No.:1996-1944
Translation or Not:no
Gender:Female
Education Level:With Certificate of Graduation for Doctorate Study
Alma Mater:江苏大学
Degree:doctor
Status:在本单位任职
School/Department:材料科学与工程学院

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