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Affiliation of Participant(s):40100
Leading Scientist:顾寄南
Nature of Project:基于场景理解和视觉推理的光电集成芯片表面缺陷检测方法研究
Project level:1
Date of Project Approval:2023-09-11
Scheduled completion time:2027-12-01
Date of Project Initiation:2024-01-01
Pre One:***质量控制与评估技术研究
Next One:智能装配机器人视觉自主识别、高精度定位与柔顺控制方法研究
