Hits:
Affiliation of Participant(s):4a4321c94a2af4ad014a2af5f5e60096
Leading Scientist:顾寄南
Nature of Project:基于场景理解和视觉推理的光电集成芯片表面缺陷检测方法研究
Project level:1
Date of Project Approval:2023-09-11
Scheduled completion time:2027-12-01
Date of Project Initiation:2024-01-01
