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基于场景理解和视觉推理的光电集成芯片表面缺陷检测方法研究

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Affiliation of Participant(s):4a4321c94a2af4ad014a2af5f5e60096

Leading Scientist:顾寄南

Nature of Project:基于场景理解和视觉推理的光电集成芯片表面缺陷检测方法研究

Project level:1

Date of Project Approval:2023-09-11

Scheduled completion time:2027-12-01

Date of Project Initiation:2024-01-01

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